SEM and AFM Characterizing the Roots Morphology of a ZnO(Sn) Thin Film Deposited on a Silicon Substrate by a Sol-Gel Spin Coating Process

Abstract

ZnO(Sn) thin films were deposited on Silicon substrates by coating prepared sols with varying amounts of Zn(CH3COO)2·2H2O and SnCl2, SnCl4 (0, 1, 2, and 5%). The films were characterized using X-ray diffractometer (XRD), scanning electron microscopy (SEM), and UV-Vis spectrophotometer. The XRD spectra indicated the presence of a wurtzite hexagonal structure in all the thin films prepared. SEM images revealed root-like morphology on the surface of thin films, with the shortest root diameter measuring between 0.15-0.35