Fabrication and Characterization of Bilayer ZnO/Cu4O3 Thin Films for Optoelectronic Application

Abstract

Herein, we report the fabrication and characterization of pure ZnO, pure Cu₄O₃ and bilayer ZnO/Cu₄O₃ thin films using cost-effective nebulizer spray pyrolysis (NSP) method deposited on glass slide substrate. The microstructural, and optical, properties of the prepared films are studied using X-ray diffraction and UV–visible spectroscopy. The X-Ray diffraction (XRD) patterns revealed that all synthesized thin layer exhibit polycrystalline nature with würtzite hexagonal structure for pure ZnO sample and tetragonal structure for pure Cu₄O₃ film. However, the bilayer film revealed a domination of the ZnO and Cu₄O₃ with (002) diffraction plane present the preferential orientation. The obtained results indicate that the crystallite size of the deposited films vary from 7.47 to 10.45 nm. From UV-vis analysis, it was found that all thin layers exhibit highly optical transmission, and bilayer films present the maximum transmission more than 80% in the visible region. The Eg values of the prepared films were ranged between 2.92 and 3.18 eV. In addition, the optical parameters such as, the refractive index and extinction coefficient of all films were determined.