Structural Properties of Nanostructured NiO Thin Films Prepared by Spray Pyrolysis Technique

Abstract

In this work, nickel oxide thin films  was fabricated on glass substrate at different temperature by spray pyrolysis technique. The NiO layers were obtained with different molar concentrations. The NiO thin films were crystallized with a cubic structure that can be related to obtaining peaks in the XRD diffraction of  NiO thin films. The nanostructures NiO thin films were studied by the XRD patterns with two peaks at 2θ = 37.5° and 43.3° corresponding to (111) and (200) plans of NiO phase structure. The NiO thin films prepared at a concentration of C=0.05 mol/l at a temperature    T= 500°C has the largest value of lattice parameter 0.42153nm. We obtained the least thickness of NiO thin films and the least crystallite size which is 11nm for the prepared thin films at a molar concentration of C=0.1 mol/l at a temperature T= 400°C.