View of SEM and AFM Characterizing the Roots Morphology of a ZnO(Sn) Thin Film Deposited on a Silicon Substrate by a Sol-Gel Spin Coating Process

Return to Article Details SEM and AFM Characterizing the Roots Morphology of a ZnO(Sn) Thin Film Deposited on a Silicon Substrate by a Sol-Gel Spin Coating Process Download Download PDF